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IEC 61967-1:2002 Integrated circuits Measurement of electromagnetic emissions, 150 kHz to 1 GHz Part 1:General conditions and definitions
IEC 61967-2:2005 Integrated circuits Measurement of electromagnetic emissions, 150 kHz to 1 GHz Part 2: Measurement of radiated emissions TEM cell and wideband TEM cell method
IEC 61967-4:2002+A1:2006 Integrated circuits Measurement of electromagnetic emissions, 150 kHz to 1 GHz Part 4: Measurement of conducted emissions 1Ω/150 Ω direct coupling method
IEC 62132-1:2006 Integrated circuits Measurement of electromagnetic immunity, 150 kHz to 1 GHz Part 1:General conditions and definitions
IEC 62132-2:2010 Integrated circuits - Measurement of electromagnetic immunity Part 2: Measurement of radiated immunity TEM cell and wideband TEM cell method
IEC 62132-4:2006 Integrated circuits Measurement of electromagnetic immunity 150 kHz to 1 GHz Part 4:Direct RF power injection method
AEC - Q100 - Rev-F STRESS TEST QUALIFICATION FOR INTEGRATED CIRCUITS Automotive Electronics Council
AEC - Q100 - Rev-G FAILURE MECHANISM BASED STRESS TEST QUALIFICATION FOR INTEGRATED CIRCUITS Automotive Electronics Council
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